Study of Drain Induced Barrier Lowering(DIBL) Effect for Strained Si nMOSFET
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Procedia Engineering
سال: 2011
ISSN: 1877-7058
DOI: 10.1016/j.proeng.2011.08.1087